晶体硅光伏组件EL检测出的黑片缺陷失效分析
龚海丹,王国峰,朱景兵
摘要(Abstract):
主要针对晶体硅太阳电池在生产过程、实验室测试和实际运行的不同阶段所观察到的4种不同类型的缺陷黑片,通过红外线(IR)、电致发光(EL)、反向偏压致发光(ReBEL)和能谱仪(EDX)等手段进行研究、分析,找出这些黑片缺陷产生的根本原因。
关键词(KeyWords): 晶体硅光伏组件;缺陷;电池黑片;失效分析;EL检测
基金项目(Foundation):
作者(Author): 龚海丹,王国峰,朱景兵
参考文献(References):
- [1]Kontges M,Kunze I,Kajari-Schr(o|¨)der S,et al.Quantifing the risk of power loss in PV modules due to micro cracks[A].25th European Photovoltaic Solar Energy Conference and Exhibition/5th World Conference on Photovoltaic Energy Conversion[C],Valencia,Spain,2010,3745-3752.
- [2]Koentges M,Siebert M,Hinken D,et al.Quantitative analysis of PV-modules by electroluminescence images for quality control[A].24st European Photovoltaic Solar Energy Conference[C],Hamburg,Germany,2009,21-24.
- [3]IEC 61215-2005.Crystalline silicon terrestrial photovoltaic(PV)modules-Design qualification and type approval[S].