硅基薄膜光电性能测试技术——电导温度曲线和光电导衰退的测试
孔光临,郝会颖,彭文博,刘石勇,张长沙,石明吉,曾湘波,廖显伯
摘要(Abstract)：
介绍了硅基薄膜电导温度曲线和光电导衰退测试设备和方法,包括测试设备、采集数据的方法及测试的操作规程等。
关键词(KeyWords)： 硅基薄膜;电导;光电导;透射谱;电池量子效率
基金项目(Foundation): 国家自然科学基金(60576036);; 国家重大基础研究973项目(2006CB202604)的资助)
作者(Author): 孔光临,郝会颖,彭文博,刘石勇,张长沙,石明吉,曾湘波,廖显伯
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