光伏组件潜在诱导衰减的研究
卞水明,陈晓高,熊保鸿
摘要(Abstract)：
光伏组件的潜在诱导衰减(PID)会减少光伏发电系统对外输出的电能,严重情况下会使光伏发电系统瘫痪,几乎无法对外输出电能。在温度为85℃和85%湿度的条件下,对单块光伏组件进行潜在诱导衰减效应的模拟测试,即组件的铝边框和输出端产生1000 V的电势差,每隔6 h测试组件的电致发光(EL)和I-V性能,老化时间持续了48 h。结果表明:该效应会使组件产生漏电,漏电程度随着实验持续的时间而变得严重。运用电容器原理去解释潜在诱导衰减产生的物理机制,前板采用亚克力板去制作新的光伏组件,能使组件的功率衰减控制在5%以内,完全具有抗PID的性能。
关键词(KeyWords)： 光电子学;抗PID光伏组件;电容效应;漏电流
基金项目(Foundation):
作者(Author): 卞水明,陈晓高,熊保鸿
参考文献(References)：
- [1]Koch S,Weber T.Potential Induced Degradation(PID)effects on PV modules[R].Berlin,2011.
- [2]SMA.Potential Induced Degradation[EB/OL].http://wenku.baidu.com/view/3524a8a7b0717fb5360cdce4.html,2011.
- [3]Schutze M,Junghanel M,Koentopp M B,et al.Laboratory Study of potential induced degradation of silicon photovoltaic modules[A].37th IEEE Photovoltaic Specialists Conference(PVSC)[C],Washington State,USA,2011.
- [4]Hacke P,Kemp M,Terwilliger K,et al.Characterization of multicrystalline silicon modules with system bias voltage applied in damp heat[A].25th European Photovoltaic Solar Energy Conference and Exhibition Valencia[C],Spain,2011.
- [5]Jin Jingsheng,Shu Bifeng,Li Junyong,et al.Using Infrared Thermography to Detect the Monocrystalline Silicon Solar Cell Leakage[A].The 10 th Chinese Solar PV Conference Collected Papers[C],Chang zhou,2008,86-91.