硅太阳电池组件工艺缺陷的红外检测技术
丁叶飞,李红波,张滢清,薛永胜,刘小宇,陈鸣波
摘要(Abstract)：
介绍了一种利用半导体电致发光原理检测硅太阳电池组件工艺缺陷的设备,并简要分析了工艺缺陷的产生及检测原理。利用电致发光原理,能够检测出虚焊、断栅、碎片和隐裂四种较明显的工艺缺陷,具有广阔的应用前景。
关键词(KeyWords)： 电致发光;太阳电池组件;工艺缺陷;死片;断栅;隐裂
基金项目(Foundation):
作者(Author): 丁叶飞,李红波,张滢清,薛永胜,刘小宇,陈鸣波
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